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Tuesday, April 21, 2020 | History

4 edition of Nanostructure science, metrology, and technology found in the catalog.

Nanostructure science, metrology, and technology

5-7 September 2001, Gaithersburg, USA

by

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  • 28 Currently reading

Published by SPIE-the International Society for Optical Engineering in Bellingham, Wash .
Written in English

    Subjects:
  • Nanotechnology -- Congresses.,
  • Nanostructures -- Congresses.,
  • Metrology -- Congresses.,
  • Microelectronics -- Congresses.

  • Edition Notes

    StatementMartin C. Peckerar, Michael T. Postek, Jr., chairs/editors.
    GenreCongresses.
    SeriesSPIE proceedings series,, v. 4608, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4608.
    ContributionsPeckerar, Martin Charles, 1946-, Postek, Michael T., Society of Photo-optical Instrumentation Engineers., National Institute of Standards and Technology (U.S.), United States. Office of Naval Research.
    Classifications
    LC ClassificationsT174.7 .N359 2002
    The Physical Object
    Paginationx, 278 p. :
    Number of Pages278
    ID Numbers
    Open LibraryOL3702287M
    ISBN 100819443476
    LC Control Number2003268907
    OCLC/WorldCa50514238

    Yogendra M. Panta, Dennis E. Farmer, Paula Johnson, Marcos A. Cheney, Shizhi Qian, Preparation of alpha sources using magneto-hydrodynamic electrodeposition for radionuclide metrology, Colloid and Interface Science, () ).   Read "Nanoscience and Nanotechnology: NIST Center for Nanoscale Science and Technology (CNST) Reports - Graphene, Single-Electron Devices (SEDs), Nanowire, Photovoltaic" by Progressive Management available from Rakuten Kobo. Multiple official documents provide a thorough and up-to-date review of theBrand: Progressive Management. Bunday, Michelson, Allgair, Tam, Chase-Colin, Dajczman, Adan, Har-Zvi (), "CD SEM Metrology Macro CD Technology-Beyond the Average," Proceedings of SPIE, v, pp Carpio, Ronald A. and Michelson, Diane K. (), "Copper Plating Bath Concentration Monitoring for mm and mm Using a Chemometric Electroanalytical Method.


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Nanostructure science, metrology, and technology Download PDF EPUB FB2

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@article{osti_, title = {Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology}, author = {Chen, Xiuguo and Du, Weichao and Yuan, Kui and Chen, Jun and Jiang, Hao, E-mail: [email protected] and Zhang, Chuanwei and Liu, Shiyuan, E-mail: [email protected] and Wuhan Eoptics Technology Co.

Ltd., Wuhan. Liu, S., Chen, X. & Zhang, C. Development of a broadband Mueller matrix ellipsometer as a powerful tool for nanostructure metrology. Thin Solid Films– (). Google ScholarCited by: @article{osti_, title = {Nanostructure symmetry: Relevance for physics and computing}, author = {Dupertuis, Marc-André and Oberli, D.

and Karlsson, K. and Dalessi, S. and Gallinet, B. and Svendsen, G.}, abstractNote = {We review the research done in recent years in our group on the effects of nanostructure symmetry, and outline its relevance both for.

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